Highly Accelerated Stress Test Chamber

HAST testing is a highly accelerated stress test methodology used to assess the reliability of chips by simulating the operating conditions of chips in a high temperature and high humidity environment to accelerate the aging and failure process.

1. Evaluate the stability of the chip in a high temperature and high humidity environment to ensure that the chip can work stably for a long time in a harsh application environment;
2. To detect problems that may be caused by high temperature and high humidity, such as solder rupture or metal wire breakage due to thermal expansion and electrical connection problems caused by corrosion;
3. Verify the reliability of the chip to provide manufacturers and customers with reliable product performance data.

In HAST testing, the test holder is the key component that connects the chip to the test equipment. It transmits electrical signals to the chip and transmits the test results back to the test equipment.The role of the test bench is to provide a reliable and stable interface to ensure normal communication between the chip and the test equipment and to ensure the accuracy and consistency of the test data.

• First of all, high temperature and high humidity are environments that test stands must be able to withstand. In HAST testing, the temperature is usually between 100°C and 150°C, and the humidity is as high as 85% to 95%. Therefore, test stands need to be able to withstand high temperatures and humidity to ensure their reliability. The choice of materials and the design of the structure of the test holder must take these factors into account to ensure that it does not fail or affect the test results during the test process.
• Secondly, the test holder must also provide good electrical performance. It should ensure good signal transmission and low resistance connections to ensure accurate communication between the chip and the test equipment. During the design and manufacturing process, it is essential to control and test the electrical characteristics of the test holder, including contact resistance, insertion loss, and signal amplitude.
• Finally, the design of the test holder should also match the requirements of the chip’s package and test equipment. Different types of chips have different package forms, such as die, QFN, BGA and so on. The test bench needs to make a corresponding design just according to the different packages of the chip.

1. Routine assessment of product reliability
   Accelerated assessment of product reliability through temperature, humidity, bias and other stresses.
2. It dramatically reduces product development cycles compared to traditional temperature and humidity testing.
   HAST test temperature is usually higher than 105 ℃, in the humidity of the environment will produce a greater pressure, thus accelerating the moisture into the product interior, can be faster to make the device internal saturation, the first commonly used HAST test 96h instead of THB test 1000h, effectively shorten the test time.
   High temperature and high humidity on the test samples, can constitute the water vapour adsorption, absorption and diffusion, the material in the inhalation of humidity expansion, performance deterioration, strength reduction, mechanical properties, adsorption of water vapour insulation materials caused by the decline in electrical properties.
3. Effectively improve the company’s test capacity and efficiency
   Due to the reduction of test time, in the same time, more products can be temperature and humidity of the reliability of the test verification. According to the U.S. authority statistics, for electronic devices, humidity on the failure of the device accounts for about 19%. The main failure modes caused by humidity: corrosion, particle migration, diffusion, hydrolysis.

1. High temperature step stress test
2. Vibration step stress test
3. Comprehensive stress test
4. Low temperature step stress test
5. Rapid thermal cycling test
6. Working stress test

HAST Weathering Test is widely used for accelerated weathering life testing of products. For example, EVA, connectors, photovoltaic modules, polymer materials, circuit boards, semiconductors, magnetic materials, integrated circuits and other products. To reduce the time for life testing of a system or product and accelerate the test process. Accelerated life testing requires additional operational and environmental stress. Users rely on the test to analyze the wear and tear and length of service life of mechanical and electronic components, as well as determine the causes of increased failure rates.

HAST highly accelerated aging tester is a kind of test equipment used to simulate the aging of products under high temperature and high humidity environments. HAST stands for Highly Accelerated Stress Test. The tester uses high temperature and high humidity to speed up the aging of products. This helps find problems that may occur in long-term use. It also guides product design and improvement. We usually use the HAST tester for product testing. It’s used in electronics, optoelectronics, and other industries. These include the chemical, automotive, and aerospace fields.

The HAST test is a highly accelerated reliability test for electronic components. It’s based on temperature and humidity. Its full name is Highly Accelerated Temperature and Humidity Stress Test. In semiconductor devices, PCBs, solar energy, display panels, and other products, the highly accelerated aging test has become a standard high temperature and high humidity test. The aging test has become the standard as a fast and effective alternative to standard high temperature and high humidity tests (e.g., 85C/85%RH-1000 hours) alternative program.

Uhast refers to temperature and humidity unbiased highly accelerated stress testing, which determines the reliability of devices under high temperature and high humidity conditions without applying bias to the device.